Rapixo frame grabbers support high-speed image capture at high resolution to detect yield-limiting defects in IC components without compromising throughput. Zebra Frame Grabbers support the latest high-bandwidth camera interfaces, including Camera Link, CoaXPress, and CoaXPress-over-Fibre, with generation-to-generation compatibility. Custom image processing algorithms using field-programmable gate arrays (FPGAs) can be ported to new machines, reducing the time and engineering overhead involved in bringing new solutions to market.
AltiZ 3D profile sensors add calibrated height data revealing minute defects that 2D alone can miss on reflective or low contrast packaging surfaces, such as cracks or molding defects. The AltiZ profile sensor captures precise profiles for coplanarity, standoff, package height, and for determining solder height while maintaining inspection speed.
Aurora Imaging Library elevates IC inspections by offering a comprehensive suite of high-speed, high-accuracy vision tools offering code-level customization for automated optical inspection (AOI) applications. These tools facilitate key tasks across multiple stages of IC manufacturing, including locating and orienting ICs using advanced geometric tools, detecting surface defects with image processing and edge detection, and verifying markings through OCR and code reading. The library also provides precise 2D and 3D measurement capabilities, ensuring compliance with strict manufacturing tolerances.
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