Inspecting Ceramic Package Chips


Building a reliable Automated Optical Inspection (AOI) system for IC Chips means catching micro‑cracks, voids, chipping, metallization defects, and dimensional drift at full line speed. A PC‑based architecture anchored by Zebra frame grabbers with Aurora Imaging Library machine vision software or Aurora Design Assistant flowchart‑based vision software provides deterministic image acquisition, robust analytics, and real‑time line control. The outcome is consistent inspection, fewer escapes, and clean traceability into PLC, MES, and QMS systems.

Machine Vision Frame Grabber Photography Website IC Packaging Inspection 16x9 3600

Build OEM AOI machines for ceramic package chip inspection with deterministic frame‑grabber capture, Aurora analytics, and real‑time control

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Automate ceramic package chip AOI with speed and clarity

Reliable AOI starts with precise, synchronized image acquisition. Zebra frame grabbers connect and synchronize multiple area‑ or line‑scan cameras, provide hardware triggering and encoder‑based timing, and coordinate strobes and I/O for consistent illumination. They stream images deterministically to the host, offering onboard processing while ensuring image capture at full speed. The Aurora Gecho logging utility records acquisition activity to aid troubleshooting and the identification of performance bottlenecks for process optimization.

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Simplify setup, changeovers, and control

OEMs can standardize inspections and speed up deployments by using the Aurora Imaging Library machine vision software. This software supports custom application development across surface inspection, metrology, defect detection, and classification. OEMs build their own unique aplications with code level customization. Zebra FDK enables users of Zebra Frame Grabbers to generate custom FPGA configurations in C/C++ to offload intensive image processing overhead from the host computer CPU to optimize inspection performance. Results from Aurora Imaging Library, including pass/fail decisions, measurements, and optional confidence scores, are published to the PLC as well as to MES, QMS, and SQL systems using standard industrial protocols.

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